The ISL55100A is a Quad pin driver and window comparator
fabricated in a wide voltage CMOS process. It is designed
specifically for Test During Burn In (TDBI) applications,
where cost, functional density, and power are all at a
premium.
This IC incorporates four channels of programmable drivers
and window comparators into a small 72 Ld QFN package.
Each channel has independent driver levels, data, and high
impedance control. Each receiver has dual comparators
which provide high and low threshold levels.
The ISL55100A uses differential mode digital inputs, and can
therefore mate directly with LVDS or CML outputs. Single
ended logic families are handled by connecting one of the
digital input pins to an appropriate threshold voltage (e.g.,
1.4V for TTL compatibility). The comparator outputs are
single-ended, and the output levels are user defined to mate
directly with any digital technology.
The 18V driver output and receiver input ranges allow this
device to interface directly with TTL, ECL, CMOS (3V, 5V,
and 7V), LVCMOS, and custom level circuitry, as well as the
high voltage (Super Voltage) level required for many special
test modes for Flash Devices.