一種新型過流保護(hù)電路的設(shè)計(jì)研究
張娜娜 梁齊
（合肥工業(yè)大學(xué)， 安徽合肥230009）
摘要：本文提出的過流保護(hù)電路利用運(yùn)算放大器虛短虛斷的原理大大提高了對(duì)輸出電流的采樣精度，從而提高了電路的可靠性；并通過增加的折回電路，有效降低了LDO（Low Drop-Out）系統(tǒng)的過流關(guān)斷功耗。本電路基于TSMC 0.6μ m CMOS 工藝設(shè)計(jì)，進(jìn)行了應(yīng)用于LDO 的Spectra 仿真，結(jié)果表明該過流保護(hù)電路可靠性高、過流關(guān)斷功耗低。
關(guān)鍵字：過流保護(hù)，LDO，可靠性，折回電路
Design of a Novel Over-Current Protection Circuit
Zhang Nana , Liang Qi (Hefei University Of Technology , Hefei , Anhui 230009, China)
Abstract : The over-current protection circuit described in this paper greatly improves the
sampling precision of output current and heightens the reliability of the circuit by using the
virtual-short and virtual-cutoff principle of operation amplifier . And more , It greatly reduces the over-current cutoff power dissipation of LDO（Low Drop-Out）by using a fold-back circuit . Based on TSMC 0.6μ m CMOS process , the Spectra simulation result applied in LDO verifies that this over-current protection circuit has good reliability and low power dissipation .
Key words : over-current , LDO（Low Drop-Out）, reliability, fold-back circuit