Semicon West被譽(yù)為北美地區(qū)最具影響力的半導(dǎo)體展會(huì)，吸引全球頂尖的半導(dǎo)體廠商、研究機(jī)構(gòu)和專(zhuān)家人士，展示前沿創(chuàng)新技術(shù)與應(yīng)用，推動(dòng)產(chǎn)業(yè)鏈交融碰撞，已成為全球半導(dǎo)體企業(yè)重要的技術(shù)交流平臺(tái)、匯聚地和風(fēng)向標(biāo)。

Semicon West 2024將于7 月 9—11日在舊金山莫斯康中心舉辦。作為半導(dǎo)體測(cè)試領(lǐng)域的領(lǐng)導(dǎo)者，SPEA當(dāng)然不會(huì)缺席。我們將在南大廳 965 號(hào)展位展示創(chuàng)新產(chǎn)品（DOT800多核混合信號(hào)測(cè)試儀、DOT800T功率半導(dǎo)體測(cè)試儀）。

期待大家蒞臨交流，共同探討行業(yè)的未來(lái)發(fā)展，攜手開(kāi)啟新的合作篇章。

DOT800——賦能提升測(cè)試效率

Visitorsto the SPEA booth will have the opportunity to experience the future of testingwith the SPEA Device Oriented Tester (DOT) platform. This revolutionarymixed-signal tester leverages a unique “tester-in-a-board” concept, integratingall test resources onto a single board. This simplifies connections betweentester channels and devices under test, streamlining the entire testingprocess.

到訪SPEA展位的觀眾，將有機(jī)會(huì)現(xiàn)場(chǎng)接觸SPEA 面向設(shè)備的測(cè)試儀 (DOT800) 。這款革命性的混合信號(hào)測(cè)試儀運(yùn)用獨(dú)特的“板上測(cè)試儀”概念，將所有測(cè)試資源集成到一塊板上。這簡(jiǎn)化了測(cè)試儀通道和被測(cè)設(shè)備之間的連接，從而簡(jiǎn)化整個(gè)測(cè)試過(guò)程。

TheDOT’s multi-processor, multi-function channel architecture seamlessly combinesanalog, digital, and signal processing capabilities. This includes multiplecontrol CPUs, DSP modules, and programmable logic units. The modular andconfigurable design allows for the inclusion of an on-board controller and upto four channel cards, enabling customization to perfectly match individualtesting requirements.

DOT800測(cè)試儀的多處理器、多功能通道架構(gòu)將模擬、數(shù)字和信號(hào)處理能力無(wú)縫銜接。它包括多個(gè)控制CPU、DSP模塊和可編程邏輯單元。模塊化和可配置的設(shè)計(jì)允許包含一個(gè)板載控制器和最多四個(gè)通道卡，賦能定制化、個(gè)性化測(cè)試需求。

Eachchannel card boasts a dedicated matrix card, further simplifying load boarddesign and reducing relay usage. SPEA’s DOT platform eliminates the need formultiple instruments of different types, allowing for a system comprised ofidentical, replicable instruments. This significantly reduces systemcomplexity, simplifies programming and maintenance, and ensures exceptionaldevice test coverage.

每個(gè)通道卡都擁有專(zhuān)用的矩陣卡，進(jìn)一步簡(jiǎn)化了負(fù)載板設(shè)計(jì)，并減少了繼電器的使用。SPEA 的 DOT 800消除對(duì)多種不同類(lèi)型儀器的需求，從而允許由相同的、可復(fù)制的儀器組成一套系統(tǒng)。它能顯著降低了系統(tǒng)復(fù)雜性，簡(jiǎn)化編程和維護(hù)，確保出色的測(cè)試覆蓋率。

DOT800T——功率半導(dǎo)體測(cè)試綜合解決方案

SPEAwill also be showcasing its DOT800T platform, a comprehensive solution forpower semiconductor testing. This versatile platform integrates all necessaryresources for performing ISO, AC, and DC tests on a wide range of powerapplications within a single machine. Designed specifically for testingtraditional silicon devices alongside cutting-edge Gallium Nitride and SiliconCarbide technologies, the DOT800T boasts industry-leading voltage and currentsource capabilities, along with high-frequency and low-current measurementprecision.

SPEA 還將展示 DOT800T ，它是一套滿(mǎn)足功率半導(dǎo)體測(cè)試的綜合解決方案。該多功能測(cè)試儀將全范圍功率應(yīng)用中進(jìn)行 ISO、AC、DC 測(cè)試所需的所有資源集成到一套設(shè)備中。專(zhuān)為測(cè)試傳統(tǒng)硅器件以及氮化鎵和碳化硅技術(shù)而設(shè)計(jì)，DOT800T擁有業(yè)界領(lǐng)先的電壓和電流源功能，以及高頻、低電流量測(cè)精度。

TheDOT800T’s multi-core architecture facilitates accurate execution of static,dynamic, and isolation tests across dedicated stations, each equipped with anindependent controller. Multiple test programs can be run concurrently inasynchronous mode, with each core controller managing its own resources,instrument connections, and test program execution.

DOT800T的多核架構(gòu)有助于跨專(zhuān)用站準(zhǔn)確執(zhí)行靜態(tài)、動(dòng)態(tài)和隔離測(cè)試，每個(gè)專(zhuān)用站都配備獨(dú)立的控制器。多個(gè)測(cè)試程序能以異步模式同時(shí)運(yùn)行，每個(gè)核心控制器管理自己的資源、儀器連接和測(cè)試程序執(zhí)行。